
December/January 2008


Infrared Technology Chips Away at Waste

Top Shelf Quality: Shelf-life Crucial in Validating Quality and Safety

Sample Prep Standards Ensure Safety

Ground Avian Flu Fears

• By Andrew Ebert, Phd; Darrell Abernethy, MD; Paul Kuznesof, Phd; Ruth K. Miller, JD; Catherine Sheehan; and Roger L. Williams, MD
• By Wes Lowery and Frank Schneider
• By Arthur Rumpf
• By Lorna McLeod
• By Belinda Mak
• By John G. Surak, Phd, Jeffery L. Cawley and Mark Gavoor