Rapid Elemental Analysis Spectroscopy Methods

Micro-EDXRF is configured as a closed-beam benchtop two-dimensional micro-XRF spectrometer, typically with a 30W powered rhodium X-ray tube, SDD detector, programmable X-Y-Z stage, fisheye camera, optical video microscopes, polycapillary X-ray optics for spot sizes of 25 micrometers, and software designed for collecting large elemental data sets and mapping distribution via “stitching.”

Figure 7. Fast alloy ID results screen on handheld XRF.
Image Credit: Bruker

TXRF. These analyzers provide ultra-trace (PPB and PPM) quantitative and semi-quantitative multi-elemental microanalysis. This capability is especially critical for ultra-low, but dangerous levels of heavy metals like arsenic and lead. TXRF spectrometers provide fast quantitative and semi-quantitative multi-element analysis of liquids, suspensions, and contaminants. TXRF is optimally suited for trace elemental analysis reaching ppb and ppm detection limit ranges.

TXRF analyzers are configured with a 50W, 50 kV X-ray tube, multilayer monochromator optics and an SDD detector to provide fast and accurate measurement of ultra-trace elements as low as 0.1 ppb in liquids. They have a variety of sample chamber tray configurations; and, in contrast to most analytical methods, sample amounts in nanograms to micrograms are sufficient.

HHXRF. When you can’t take samples to the analyzer, you can bring a portable XRF to them. HHXRF analyzers are the most agile XRF analyzers for the simultaneous measurement of elements anywhere they’re needed. Although they are primarily used for in-situ

Figure 8. Cataloged spectral fingerprints of relevant process equipment in production line folder for contaminant spectral fingerprint matching with handheld XRF analyzers.

Image Credit: Bruker

measurements, such as alloy or metal identification of in-use equipment or incoming materials, they can also be set up in benchtop stands for use with prepared or small samples. They are ideal when immediate results are needed on the production floor.

HHXRF is an open-beam technology, typically with a 2-4W powered X-ray tube, silicon PiN or SDD detector, internal camera, variable spot sizes up to 8 mm, application-specific filters, and software capable of qualitative and quantitative analysis. Some HHXRF analyzers provide the ability to use customized filters and even vacuum or helium flush for light element analysis.

Russell works in business and market development for the Bruker Nano Analytics Division. Reach her at [email protected].